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XYZΘΦ Scanning Slit Beam Profiler

Select the BeamMap2-CM option if you need to measure the divergence of a well-collimated beam in real-time.

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Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Port-powered USB 2.0; flexible 3 m cable; no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Real-time multiple Z plane scanning slit system
  • Real-time XYZ profiles, Focus position
  • Real-time M2, Divergence, Collimation, Alignment

 

Applications

  • Laser printing & marking
  • Medical lasers
  • Diode laser systems
  • Fibre optic telecom assembly focusing –
    LensPlate2™ option for re-imaging waveguides and fibre ends
  • Development, production, field service
  • CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
  • M2 measurement with available M2DU stage
Wavelength Si detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned Beam Diameters Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode*
InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*
InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode*
Beam Waist Diameter Measurement Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
1/e2 (13.5%) width
User selectable % of peak
Knife-Edge mode* for very small beams
Beam Waist Position Measurement ± 20 µm best in X, Y, and Z — contact DataRay for recommendation
Measured Sources CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
Resolution Accuracy 0.1 µm or 0.05% of scan range
± < 2% ± = 0.5 µm
M2 Measurement 1 to > 20, ± 5%
Divergence/Collimation, Pointing 1 mrad best — contact Laser 2000 for recommendation
Maximum Power & Irradiance 1 W Total & 0.5 mW/µm2
Gain Range 1,000:1 Switched 4,096:1 ADC range
Displayed Graphics X-Y-Z Position & Profiles, Zoom x1 to x16
Update Rate ~5 Hz
Pass/Fail Display On-screen selectable Pass/Fail colors. Ideal for QA & Production.
Averaging User selectable running average (1 to 8 samples)
Statistics Min., Max., Mean, Standard Deviation
Log data over extended periods
XY Profile & Centroid Beam Wander display and logging
Minimum PC Requirements Windows, 2 GB RAM, USB 2.0/3.0 port

* Knife-Edge mode requires 3XYKE or CM3 model

Multiple plane spacing options available – please review the worksheet in the downloads section to identify the correct plane spacing for your application

BeamMap2

Model Plane Spacing
4XY 100 µm: -100, 0, +100, +400 µm
250 µm: -250, 0, +250, +1000 µm
500 µm: -500, 0, +500, +2000 µm
750 µm: -750, 0, +750, +3000 µm
3XYKE 50 µm: -50, 0, +50, 0 µm
100 µm: -100, 0, +100, 0 µm

 

BeamMap2-CM

Model Plane Spacing
CM4 5 mm: -5, 0, +5, +20 mm
CM3 10 mm: -10, 0, +10, 0 mm
Scanning-Slit-Beam-Profilers-Datasheet
BeamMap2-Series_Choice_Worksheet
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BeamMap2 Series

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