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XY Scanning Slit Beam Profiler

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XY Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
  • Port-powered USB 2.0; flexible 3 m cable; no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Economical and accurate
  • M2 option – beam propagation analysis, divergence, focus

 

Applications

  • Laser printing & marking
  • Medical lasers
  • Diode laser systems
  • Fibre optic telecom assembly focusing –
    LensPlate2™ option for re-imaging waveguides and fibre ends
  • Development, production, field service
  • CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
  • M2 measurement with available M2DU stage
Wavelength Si detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned Beam Diameters Si detector: 5 µm to 4 mm‚ to 2 µm in Knife-Edge mode
InGaAs detector: 10 µm to 3 mm‚ to 2 µm in Knife-Edge mode
InGaAs (extended) detector: 10 µm to 2 mm‚ to 2 µm in Knife-Edge mode
Beam Waist Diameter Measurement Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
1/e² (13.5%) width
User selectable % of peak
Knife-Edge mode for very small beam
Measured Sources CW; Pulsed lasers‚ Φ µm ≥ [500/(PRR in kHz)]
Resolution Accuracy 0.1 µm or 0.05% of scan range
± < 2% ± = 0.5 µm
Maximum Power & Irradiance 1 W Total & 0.5 mW/µm²
Gain Range 1‚000:1 Switched; 4‚096:1 ADC range
Displayed Graphics X-Y Position & Profiles‚ Zoom x1 to x16
Update Rate ~5 Hz
Pass/Fail Display On-screen selectable Pass/Fail colors. Ideal for QA & Production.
Averaging User selectable running average (1 to 8 samples)
Statistics Min.‚ Max.‚ Mean‚ Standard Deviation
Log data over extended periods
XY Profile & Centroid Beam Wander display and logging
Minimum PC Requirements Windows, 2 GB RAM, USB 2.0/3.0 port

Beam’R2

Model Wavelength
Silicon 190 to 1150 nm
InGaAs 650 to 1800 nm
Silicon + InGaAs 190 to 1800 nm
Silicon + InGaAs Extended-2300 190 to 2300 nm
Silicon + InGaAs Extended-2500 190 to 2500 nm
Scanning-Slit-Beam-Profilers-Datasheet
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Beam'R2 Series

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