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488/543/594 nm lasers BrightLine® triple-edge laser dichroic beamsplitter

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Optimized beamsplitters for the most popular lasers used in fluorescence imaging, including newer all-solid-state lasers for conventional laser based microscopy such as confocal imaging. All beamsplitters in this category have exceptional reflectance at the laser wavelengths, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light. This dichroic beamsplitter is optimized for reflecting laser beams up to 2.5 mm in diameter while minimizing RWE.

Optical Specifications
Transmission BandBand 1: Tavg > 93% 503 – 528.5 nm
Band 2: Tavg > 93% 558 – 574 nm
Band 3: Tavg > 93% 609 – 800 nm
Reflection BandBand 1: Rabs > 94% 471 – 491 nm
Band 2: Rabs > 94% 541.5 – 544.5 nm
Band 3: Rabs > 94% 588 – 594.5 nm
Reflection Band, p-polRabs > 90% 471 – 491 nm
Rabs > 90% 541.5 – 544.5 nm
Rabs > 90% 588 – 594.5 nm
Reflection Band, s-polRabs > 98% 471 – 491 nm
Rabs > 98% 541.5 – 544.5 nm
Rabs > 98% 588 – 594.5 nm
Edge WavelengthBand 1: 499 nm
Band 2: 552 nm
Band 3: 603 nm


General Specifications
Angle of Incidence45 ° with a shift of 0.35%/° (40 – 50 °)
Cone Half-angle0.5 °
SteepnessSteep
Filter Effective Index1.77 Understanding 'Effective Index of Refraction' neff
Optical Damage Rating2 J/cm sq. at 532 nm (for a 532 nm filter)
Flatness / RWE ClassificationLaser
Reflected Wavefront Error< 6 P-V RWE @ 632.8


Physical Specifications (for standard parts - please contact us for custom sizes)
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Filter Thickness, Unmounted1.05 mm
Filter Thickness Tolerance, Unmounted± 0.05 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeFused Silica
OrientationReflective surface marked with part–Orient in incoming light


Di01-R488/543/594-25x36

  • Size: 25.2 x 35.6 x 1.1 mm

Transmission

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Optical Density

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Semrock Spectral Plot Info
Di01-R488_543_594_Spectrum

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