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405/488/594 nm lasers BrightLine® triple-edge laser dichroic beamsplitter

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Optimized beamsplitters for the most popular lasers used in fluorescence imaging, including newer all-solid-state lasers for conventional laser based microscopy such as confocal imaging. All beamsplitters in this category have exceptional reflectance at the laser wavelengths, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light. This dichroic beamsplitter is optimized for reflecting laser beams up to 2.5 mm in diameter while minimizing RWE.

Note on spectral plots:
In the past, each shipment has included a spectral plot for every filter and every lot code in the shipment. In an effort to be more eco-friendly, we will no longer be including these plots with each shipment. If you require spectral plot data, please see here for more information.

Optical Specifications
Transmission BandBand 1: Tavg > 93% 429.5 – 462.0 nm
Band 2: Tavg > 93% 502.5 – 574.5 nm
Band 3: Tavg > 93% 612.0 – 800.0 nm
Reflection BandBand 1: Rabs > 94% 370 – 410 nm
Band 2: Rabs > 94% 473 – 491 nm
Band 3: Rabs > 94% 588.3 – 594.3 nm
Reflection Band, p-polBand 1: Rabs > 90% 370 – 410 nm
Band 2: Rabs > 90% 473 – 491 nm
Band 3: Rabs > 90% 588.3 – 594.3 nm
Reflection Band, s-polBand 1: Rabs > 98% 370 – 410 nm
Band 2: Rabs > 98% 473 – 491 nm
Band 3: Rabs > 98% 588.3 – 594.3 nm
Laser WavelengthBand 1: 375 nm ± 3
Band 1: 405 nm ± 5
Band 2: 473 nm +2/-0
Band 2: 488 nm +3/-2
Band 3: 593.5 nm
Band 3: 594.0 nm ± 0.3
Band 3: 594.1 nm
Edge WavelengthBand 1: 420.4 nm
Band 2: 497.8 nm
Band 3: 602.3 nm


General Specifications
Angle of Incidence45 ° with a shift of 0.35%/° (40 – 50 °)
Cone Half-angle0.5 °
SteepnessSteep
Filter Effective Index1.85 Understanding 'Effective Index of Refraction' neff
Optical Damage Rating2 J/cm² at 532 nm (for a 532 nm filter)
Flatness / RWE ClassificationLaser
Reflected Wavefront Error< 6λ P-V RWE @ 632.8


Physical Specifications (for standard parts - please contact us for custom sizes)
Mounted / UnmountedUnmounted
ShapeRectangular
Size22.0 x 29.0 x 1.1 mm
25.2 x 35.6 x 1.1 mm
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Transverse Tolerance, Mounted± 0.1 mm
Filter Thickness, Unmounted1.05 mm
Filter Thickness Tolerance, Unmounted± 0.05 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate Thickness1.05 mm
Substrate TypeFused Silica
OrientationReflective surface marked with part number – Orient in direction of incoming light


Di01-R405/488/594-22x29

  • Size: 22.0 x 29.0 x 1.1 mm

Di01-R405/488/594-25x36

  • Size: 25.2 x 35.6 x 1.1 mm

Transmission

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Optical Density

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Semrock Spectral Plot Info
Di01-R405_488_594_Spectrum
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Di01-R405/488/594

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Peter Collins

Peter Collins

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MPhys

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