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Laser 2000
Home > Products > Test & Measurement > Beam Profilers > Scanning Slit Profilers XYZθɸ > XYZΘΦ Scanning Slit Beam Profiler

XYZΘΦ Scanning Slit Beam Profiler

BeamMap2 Series

Select the BeamMap2-CM option if you need to measure the divergence of a well-collimated beam in real-time.

DataRay Logo

Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Port-powered USB 2.0; flexible 3 m cable; no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Real-time multiple Z plane scanning slit system
  • Real-time XYZ profiles, Focus position
  • Real-time M2, Divergence, Collimation, Alignment

 

Applications

  • Laser printing & marking
  • Medical lasers
  • Diode laser systems
  • Fibre optic telecom assembly focusing –
    LensPlate2™ option for re-imaging waveguides and fibre ends
  • Development, production, field service
  • CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
  • M2 measurement with available M2DU stage
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