SWIR (short-wavelength infrared) imaging is a great solution for nondestructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality.
Integrating SWIR imaging into production lines requires cameras such as the C15333-10E InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection.
Features
- SWIR sensitivity from 950 nm to 1700 nm
- 1024 pixel linear array
- Maximum line rate: 40 kHz
- Interface: Employs Gigabit Ethernet
- Equipped with high quality images (Back ground subtraction, Real time shading correction)
Applications
- Food and agricultural products (damage inspection, quality screening, material discrimination, etc.)
- Semiconductors (Si wafer pattern inspection, solar cell inspection by EL/PL, etc.)
- Industry (moisture content, leak detection, container inspection, etc.)