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835 nm BrightLine® multiphoton 3P short-pass super-resolution / TIRF dichroic beamsplitter

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Innovative short pass dichroic beamsplitter optimized for 3-photon laser excitation in a standard epi-fluorescence microscope configuration with reflected excitation and transmitted emission.The 2-photon (Red) and 3-photon (Green & Red) excitation regions are ideal for femtosecond pulsed lasers such as Ti:Sapphire, OPO or OPA coupled, and neodymium- and ytterbium-doped lasers, enabling deep tissue imaging with improved contrast. This multiphoton dichroic has low reflected GDD that helps minimize temporal pulse broadening of reflected 1300 nm and 1700 nm laser pulses, and very high and flat reflection and transmission bands.Semrock’s Super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and super-resolution techniques such as TIRF, PALM, STORM, structured illumination, STED, and multiphoton imaging.2.5λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 6 mm in diameter while minimizing RWEλ/3 P-V RWE on 3 mm, optimized for reflecting laser beams up to 16.7 mm in diameter while minimizing RWE

Optical Specifications
Transmission BandTavg > 80% 400 – 420 nm
Tavg > 90% 400 – 820 nm
Tavg > 90% 420 – 820 nm
Reflection BandRavg > 94% 1200 – 1350 nm
Ravg > 94% 1600 – 1870 nm
Reflection Band, p-polRavg > 90% 1200 – 1350
Ravg > 90% 1600 – 1870
Reflection Band, s-polRavg > 98% 1200 – 1350
Ravg > 98% 1600 – 1870
Edge Wavelength835 nm


General Specifications
Angle of Incidence45 ± 1.5 °
Cone Half-angle2 °
SteepnessStandard
Filter Effective Index1.87 Understanding 'Effective Index of Refraction' neff
Group Delay Dispersion± 1500 fs over 1200 - 1350 nm reflection band for S-Pol and P-Pol
± 750 fs over 1600 - 1870 nm reflection band for S-Pol and P-Pol
Optical Damage Rating1 J/cm sq. @ 532 nm (10 ns pulse width)
Flatness / RWE ClassificationSuper-resolution / TIRF


Physical Specifications (for standard parts - please contact us for custom sizes)
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeFused Silica
OrientationReflective surface has laser dot–Orient in incoming light


FF835-SDi01-t1-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.05 mm
  • Filter Thickness, Unmounted: 1.05 mm
  • Search-Laser-Wavelength: 835 nm
  • Laser Wavelength: 835 nm
  • Reflected Wavefront Error: < 2.5 P-V RWE @ 632.8
  • Maximum Reflected Laser Beam Diameter: 6 mm
  • Nominal Flatness: < 1.4 P-V per inch @ 632.8

FF835-SDi01-t3-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.1 mm
  • Filter Thickness, Unmounted: 3.0 mm
  • Search-Laser-Wavelength: 1200 nm,1300 nm,1350 nm,1600 nm,1700 nm,1870 nm,835 nm
  • Laser Wavelength: 1200 nm
    1300 nm
    1350 nm
    1600 nm
    1700 nm
    1870 nm
    835 nm
  • Reflected Wavefront Error: < 0.33 P-V RWE @ 632.8
  • Maximum Reflected Laser Beam Diameter: 16.7 mm
  • Nominal Flatness: < 0.19 P-V per inch @ 632.8

Transmission

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Optical Density

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Semrock Spectral Plot Info
FF835-SDi01_Spectrum

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