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835 nm BrightLine® multiphoton 3P short-pass super-resolution / TIRF dichroic beamsplitter

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Innovative short pass dichroic beamsplitter optimized for 3-photon laser excitation in a standard epi-fluorescence microscope configuration with reflected excitation and transmitted emission.

The 2-photon (Red) and 3-photon (Green & Red) excitation regions are ideal for femtosecond pulsed lasers such as Ti:Sapphire, OPO or OPA coupled, and neodymium- and ytterbium-doped lasers, enabling deep tissue imaging with improved contrast. This multiphoton dichroic has low reflected GDD that helps minimize temporal pulse broadening of reflected 1300 nm and 1700 nm laser pulses, and very high and flat reflection and transmission bands.

Semrock’s Super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and super-resolution techniques such as TIRF, PALM, STORM, structured illumination, STED, and multiphoton imaging.

2.5λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 6 mm in diameter while minimizing RWE
λ/3 P-V RWE on 3 mm, optimized for reflecting laser beams up to 16.7 mm in diameter while minimizing RWE

Note on spectral plots:
In the past, each shipment has included a spectral plot for every filter and every lot code in the shipment. In an effort to be more eco-friendly, we will no longer be including these plots with each shipment. If you require spectral plot data, please see here for more information.

Optical Specifications
Transmission BandTavg > 80% 400 – 420 nm (Rolling Window: 10 nm)
Tavg > 90% 400 – 820 nm
Tavg > 90% 420 – 820 nm (Rolling Window: 10 nm)
Reflection BandRavg > 94% 1200 – 1350 nm
Ravg > 94% 1600 – 1870 nm
Reflection Band, p-polRavg > 90% 1200 – 1350
Ravg > 90% 1600 – 1870
Ravg > 98% 1200 – 1350
Ravg > 98% 1600 – 1870
Laser Wavelength1200 - 1350 nm
1600 - 1870 nm
Edge Wavelength835 nm


General Specifications
Angle of Incidence45 ± 1.5 °
Cone Half-angle2 °
Filter Effective Index1.87 Understanding 'Effective Index of Refraction' neff
Group Delay Dispersion± 1500 fs² over 1200 - 1350 nm reflection band for S-Pol and P-Pol
± 750 fs² over 1600 - 1870 nm reflection band for S-Pol and P-Pol
Optical Damage Rating1 J/cm² @ 532 nm (10 ns pulse width)
Flatness / RWE ClassificationSuper-resolution / TIRF
Reflected Wavefront Error< 0.33λ P-V RWE @ 632.8
< 2.5λ P-V RWE @ 632.8
Max Beam Diameter16.7 mm
6 mm


Physical Specifications (for standard parts - please contact us for custom sizes)
Mounted / UnmountedUnmounted
ShapeRectangular
Size25.2 x 35.6 x 1.1 mm
25.2 x 35.6 x 3.0 mm
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Transverse Tolerance, Mounted± 0.1 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeFused Silica
OrientationReflective surface marked with laser dot – Orient in direction of incoming light


FF835-SDi01-t1-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.05 mm
  • Filter Thickness, Unmounted: 1.05 mm
  • Size: 25.2 x 35.6 x 1.1 mm
  • Substrate Thickness: 1.05 mm
  • Substrate Thickness Tolerance, Unmounted: ± 0.05 mm
    ± 0.1 mm

FF835-SDi01-t3-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.1 mm
  • Filter Thickness, Unmounted: 3.0 mm
  • Size: 25.2 x 35.6 x 3.0 mm
  • Substrate Thickness: 3.0 mm
  • Substrate Thickness Tolerance, Unmounted: ± 0.1 mm

Transmission

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Optical Density

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Semrock Spectral Plot Info
FF835-SDi01_Spectrum
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Our knowledgeable sales team will be happy to help. We can normally source exactly what you need, or work with you to come up with custom solutions.

Alternatively, just call +44 (0) 1933 461 666 and ask to speak to the Photonics team.

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