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660 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

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The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.Semrock’s super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWEλ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE **Limited quantities of Di03-R660-t3-25×36 parts remain available. Final availability and delivery will be confirmed upon receipt of order**

Optical Specifications
Transmission Band Tavg > 93% 677.0 – 1200 nm

Reflection Band Rabs > 94% 647.1 – 665.0 nm
Ravg > 90% 350.0 – 647.1 nm

Reflection Band, p-pol Rabs > 90% 647.1 – 665.0 nm

Reflection Band, s-pol Rabs > 98% 647.1 – 665.0 nm

Laser Wavelength 647.1 nm
660 nm

Edge Wavelength 672.9 nm
General Specifications
Angle of Incidence 45 ° with a shift of 0.35%/° (40 – 50 °)

Cone Half-angle 0.5 °

Steepness Steep

Filter Effective Index 1.79 Understanding ‘Effective Index of Refraction’ neff

Optical Damage Rating Not tested

Flatness / RWE Classification Super-resolution / TIRF
Physical Specifications (for standard parts – please contact us for custom sizes)
Transverse Dimensions, LxW 25.2 mm x 35.6 mm

Clear Aperture ≥ 80% (elliptical)

Surface Quality (Scratch-Dig) 60-40

Substrate Type Fused Silica

Orientation Reflective surface has laser dot–Orient in incoming light

Di03-R660-t1-25×36

  • Filter Thickness Tolerance, Unmounted: ± 0.05 mm
  • Filter Thickness, Unmounted: 1.05 mm
  • Reflected Wavefront Error: < 1 P-V RWE @ 632.8

Di03-R660-t3-25×36

  • Filter Thickness Tolerance, Unmounted: ± 0.1 mm
  • Filter Thickness, Unmounted: 3.0 mm
  • Reflected Wavefront Error: < 0.2 P-V RWE @ 632.8

Transmission

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Optical Density

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Semrock Spectral Plot Info
Di03-R660_Spectrum

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Di03-R660

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