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850 nm BrightLine® Multiphoton LaserMUX™ Beam Combiner

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Multiphoton LaserMUX™ beam combiners enable deeper tissue imaging and improved contrast in multi-color and multi-modal fluorescence microscopy. The filters set new performance standards by simultaneously achieving high transmission, high reflection, and low GDD over both reflection & transmission, while maintaining minimal wavefront distortion. Ideal for combining two femtosecond pulsed laser beams, they are perfect for optogenetics and other life science applications. Combine two or more femtosecond pulsed lasers such as Ti:Sapphire (& OPO coupled), neodymium and ytterbium-doped fiber and glass lasers, and Cr-forsterite lasers. < ± 100 fs² Group Delay Dispersion over popular femtosecond laser wavelengths

Optical Specifications
Transmission BandTavg > 93% 890 – 2100 nm over any 10 nm window
Transmission Band, p-polTavg > 95% 845 – 2100
Transmission Band, s-polTavg > 90% 890 – 2100
Reflection BandRavg > 95% 670 – 815 nm over any 10 nm window
Reflection Band, p-polRavg > 90% 670 – 815 nm
Reflection Band, s-polRavg > 98% 670 – 849 nm
Edge Wavelength850 nm


General Specifications
Angle of Incidence45 ± 1.5 °
Cone Half-angle2 °
SteepnessStandard
Filter Effective Index1.7 Understanding 'Effective Index of Refraction' neff
Group Delay Dispersion Reflection (p-pol)&plusmn; 100 fs² over 691 – 795
&plusmn; 500 fs² over 683 – 812
Group Delay Dispersion Reflection (s-pol)&plusmn; 100 fs² over 670 – 828
&plusmn; 500 fs² over 670 – 840
Group Delay Dispersion Transmission (p-pol)&plusmn; 100 fs² over 917 – 2050 (excluding substrate, by design)
&plusmn; 500 fs² over 873 – 2100 (excluding substrate, by design)
Group Delay Dispersion Transmission (s-pol)&plusmn; 100 fs² over 965 – 2050 (excluding substrate, by design)
&plusmn; 500 fs² over 913 – 2100 (excluding substrate, by design)
Optical Damage Rating50 mJ/cm sq. @ 800 nm (50 fs pulse width)
Flatness / RWE ClassificationSuper-resolution / TIRF
Transmitted Wavefront Error/10 PV over CA @ 632.8
Reflected Wavefront Error< 1 P-V RWE @ 632.8


Physical Specifications (for standard parts - please contact us for custom sizes)
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Filter Thickness, Unmounted1.05 mm
Filter Thickness Tolerance, Unmounted± 0.05 mm
Clear Aperture≥ 85% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeFused Silica
OrientationReflective surface has laser dot–Orient in incoming light


FF850-Di01-t1-25x36

  • Size: 25.2 x 35.6 x 1.1 mm

Transmission

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Optical Density

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Semrock Spectral Plot Info
FF850-Di01_Spectrum

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