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785 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

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The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.Semrock’s super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWEλ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE

Optical Specifications
Transmission BandTavg > 93% 804.3 – 1600 nm
Reflection BandRabs > 94% 780 – 790 nm
Ravg > 90% 350 – 780 nm
Reflection Band, p-polRabs > 90% 780 – 790 nm
Reflection Band, s-polRabs > 98% 780 – 790 nm
Edge Wavelength800 nm


General Specifications
Angle of Incidence45 ° with a shift of 0.35%/° (40 – 50 °)
Cone Half-angle0.5 °
SteepnessSteep
Filter Effective Index2.04 Understanding 'Effective Index of Refraction' neff
Optical Damage Rating1 J/cm sq. @ 532 nm (10 ns pulse width)
Flatness / RWE ClassificationSuper-resolution / TIRF


Physical Specifications (for standard parts - please contact us for custom sizes)
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeFused Silica
OrientationReflective surface has laser dot–Orient in incoming light


Di03-R785-t1-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.05 mm
  • Filter Thickness, Unmounted: 1.05 mm
  • Search-Laser-Wavelength: 800 nm
  • Reflected Wavefront Error: < 1 P-V RWE @ 632.8
  • Laser Wavelength: 800 nm

Di03-R785-t3-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.1 mm
  • Filter Thickness, Unmounted: 3.0 mm
  • Search-Laser-Wavelength: 785 nm,800 nm
  • Reflected Wavefront Error: < 0.2 P-V RWE @ 632.8
  • Laser Wavelength: 785 nm
    800 nm

Transmission

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Optical Density

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Semrock Spectral Plot Info
Di03-R785_Spectrum

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Di03-R785

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