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635 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

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The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.

Semrock’s super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.

1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
λ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE

Note on spectral plots:
In the past, each shipment has included a spectral plot for every filter and every lot code in the shipment. In an effort to be more eco-friendly, we will no longer be including these plots with each shipment. If you require spectral plot data, please see here for more information.

Optical Specifications
Transmission BandTavg > 93% 658.8 – 1200 nm
Reflection BandRabs > 94% 632.8 – 647.1 nm
Reflection Band, p-polRabs > 90% 632.8 – 647.1 nm
Reflection Band, s-polRabs > 98% 632.8 – 647.1 nm
Laser Wavelength632.8 nm
635 nm +7/-3
647.1 nm


General Specifications
Angle of Incidence45 ° with a shift of 0.35%/° (40 – 50 °)
Cone Half-angle0.5 °
Filter Effective Index1.76 Understanding 'Effective Index of Refraction' neff
Optical Damage Rating1 J/cm² @ 532 nm (10 ns pulse width)
Flatness / RWE ClassificationSuper-resolution / TIRF
Reflected Wavefront Error< 0.2λ P-V RWE @ 632.8
< 1λ P-V RWE @ 632.8


Physical Specifications (for standard parts - please contact us for custom sizes)
Mounted / UnmountedUnmounted
ShapeRectangular
Size25.2 x 35.6 x 1.1 mm
25.2 x 35.6 x 3.0 mm
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Transverse Tolerance, Mounted± 0.1 mm
Substrate Thickness Tolerance, Unmounted± 0.05 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeLow-autofluorescence optical quality glass


Di03-R635-t1-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.05 mm
  • Filter Thickness, Unmounted: 1.05 mm
  • Size: 25.2 x 35.6 x 1.1 mm
  • Substrate Thickness: 1.05 mm

Di03-R635-t3-25x36

  • Filter Thickness Tolerance, Unmounted: ± 0.1 mm
  • Filter Thickness, Unmounted: 3.0 mm
  • Size: 25.2 x 35.6 x 3.0 mm
  • Substrate Thickness: 3.0 mm

Transmission

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Optical Density

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Semrock Spectral Plot Info
Di03-R635_Spectrum
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Di03-R635

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If you’re interested in the products shown here, or have questions about something you can’t find on our website, please get in touch through the form below.

Our knowledgeable sales team will be happy to help. We can normally source exactly what you need, or work with you to come up with custom solutions.

Alternatively, just call +44 (0) 1933 461 666 and ask to speak to the Photonics team.

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