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880 nm BrightLine® multiphoton 2P short-pass super-resolution / TIRF dichroic beamsplitter

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Innovative short pass dichroic beamsplitter optimized for 2-photon laser excitation in a standard epi-fluorescence microscope configuration with reflected excitation and transmitted emission.The 2-photon (Green & Red) and 3-photon (Green) excitation regions are ideal for femtosecond pulsed lasers such as 920 nm, Ti:Sapphire, OPO or OPA coupled, and neodymium- and ytterbium-doped lasers, enabling deep tissue imaging with improved contrast. This multiphoton dichroic has low reflected GDD that helps minimize temporal pulse broadening of reflected 910 nm to 1400 nm laser pulses, and very high and flat reflection and transmission bands.Semrock’s Super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and super-resolution techniques such as TIRF, PALM, STORM, structured illumination, STED, and multiphoton imaging.2.5λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 6 mm in diameter while minimizing RWEλ/3 P-V RWE on 3 mm, optimized for reflecting laser beams up to 16.7 mm in diameter while minimizing RWE

Optical Specifications
Transmission BandTavg > 80% 400 – 420 nm
Tavg > 90% 400 – 850 nm
Tavg > 90% 420 – 850 nm
Reflection BandRavg > 94% 910 – 1400 nm
Reflection Band, p-polRavg > 90% 910 – 1400
Reflection Band, s-polRavg > 98% 910 – 1400
Edge Wavelength880 nm


General Specifications
Angle of Incidence45 ± 1.5 °
Cone Half-angle2 °
SteepnessStandard
Filter Effective Index1.71 Understanding 'Effective Index of Refraction' neff
Group Delay Dispersion± 1250 fs over 910 - 1225 nm reflection band for S-Pol and P-Pol
± 500 fs over 1225 - 1400 nm reflection band for S-Pol and P-Pol
Optical Damage Rating1 J/cm sq. @ 532 nm (10 ns pulse width)
Flatness / RWE ClassificationSuper-resolution / TIRF


Physical Specifications (for standard parts - please contact us for custom sizes)
Transverse Dimensions, LxW25.2 mm x 35.6 mm
Clear Aperture≥ 80% (elliptical)
Surface Quality (Scratch-Dig)60-40
Substrate TypeFused Silica
OrientationReflective surface has laser dot–Orient in incoming light


FF880-SDi01-t1-25×36

  • Filter Thickness Tolerance, Unmounted: ± 0.05 mm
  • Filter Thickness, Unmounted: 1.05 mm
  • Search-Laser-Wavelength: 835 nm
  • Laser Wavelength: 835 nm
  • Reflected Wavefront Error: < 2.5 P-V RWE @ 632.8
  • Maximum Reflected Laser Beam Diameter: 6 mm
  • Nominal Flatness: < 1.4 P-V per inch @ 632.8

FF880-SDi01-t3-25×36

  • Filter Thickness Tolerance, Unmounted: ± 0.1 mm
  • Filter Thickness, Unmounted: 3.0 mm
  • Search-Laser-Wavelength: 1000 nm,1100 nm,1200 nm,1300 nm,1400 nm,835 nm,880 nm,910 nm
  • Laser Wavelength: 1000 nm
    1100 nm
    1200 nm
    1300 nm
    1400 nm
    835 nm
    880 nm
    910 nm
  • Reflected Wavefront Error: < 0.33 P-V RWE @ 632.8
  • Maximum Reflected Laser Beam Diameter: 16.7 mm
  • Nominal Flatness: < 0.19 P-V per inch @ 632.8

Transmission

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Optical Density

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Semrock Spectral Plot Info
FF880-SDi01_Spectrum

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